PID (Potential Induced Degradation) is power loss in PV modules caused by leakage current driven by high voltage between the cells and the grounded frame. Modules are screened for it with the IEC TS 62804-1 test. Designers manage PID risk through module selection, string voltage, inverter grounding and PID-recovery functions, especially in hot, humid sites.
PID Mechanism
- High voltage between cells and grounded frame.
- Humidity + heat enable ion migration through encapsulant.
- Ions accumulate at cell-glass interface.
- Shunt resistance decreases → Pmax drops.
- Voc drops; FF drops.
Prevention
- PID-free / PID-resistant modules: certified per IEC 62804.
- Recovery systems: nightly reverse-voltage application (some inverters).
- Grounding strategy: PID-N (negative ground), the specific bonding and grounding scheme is what actually gets documented on the module frame bonding detail and the project’s electrical drawing set.
- Encapsulant quality: high-quality EVA, POE backsheets.
Detection
- IR thermography during operation.
- I-V curve tracing.
- Power output monitoring (sudden drops).
Why String Position Matters
PID is not evenly distributed across a plant, it concentrates wherever the voltage-to-ground stress is highest, which in a long series string is almost always at the bottom of the string (for negatively grounded systems) or the top (for positively grounded systems).
A 1500V central-inverter design puts far more modules at high voltage-to-ground than a string-inverter layout at 1000V, which is one reason PID risk is a factor in string-sizing decisions and not just a module-datasheet checkbox.
Humid, hot climates accelerate the ion-migration mechanism described above, so the same module and string length that shows negligible PID in a dry climate can lose meaningful output within a couple of operating seasons in a coastal or monsoon-heavy site, this is why field monitoring during the first year, not just the module’s IEC 62804 certificate, is what actually confirms whether PID is under control on a given plant.
Key Takeaways
- PID = leakage-current-driven module degradation.
- Can cause 20-50% power loss in months on unmanaged systems.
- TOPCon and HJT more PID-resistant than PERC.
- Specify PID-resistant modules per IEC 62804.
- Use PID-recovery systems on long strings in humid/hot climates.
Related Reading
PID losses that go undetected in year one show up later as a gap between modeled and actual generation, which is exactly the risk a bankable yield report is built to price in, see P50 / P90 / P99 in Solar Yield Reports for how uncertainty from module-level effects like PID factors into the exceedance-probability numbers lenders rely on.
Because PID risk is highest in long, high-voltage strings, it’s worth reviewing alongside the degradation rate assumptions used in the underlying yield simulation, since both feed the same 25-year output forecast.
On the electrical side, the grounding scheme chosen to mitigate PID (PID-N or PID-P) has to be documented consistently with the plant’s module frame bonding and grounding details, which is where our Electrical CEIG Drawings work overlaps with module-quality decisions made earlier in procurement.
Frequently Asked Questions
4 commonly searched questions about PID (Potential Induced Degradation).
What causes PID in solar panels?
How can PID be prevented or reversed?
Are TOPCon and HJT modules less prone to PID than PERC?
How is PID detected in an operating solar plant?
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Keyur Rakholiya